CIRCUIT LIFE AT TEMPERATURE

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A highlight of our product is its performance. As demonstrated on Quartzdyne’s circuits: our techniques, equipment, and dedication to excellence delivers, on average, a product that increases circuit life by 100 times that of surface mount technologies. We have over 10 million hours of testing to show confidence in our product. We destructively test samples from every production lot of circuits and the results are visualized on the chart. For more information on this test see the electronics section of our technical papers.

• 285°C Resistor Drift and Failure Analysis (HiTEC 2010)
• High Temperature CMOS Reliability and Drift (HiTEC 2010)
• Voltage Regular and Frequency Counting ASICs (2009 HITEN)
• Design Considerations for High Temperature Hybrid Manufacturability (2008 HITEN)
• A 225°C Rated ASIC for Quartz Based Downhole Transducers (2007 HITEN)
• Circuit Design for High Temperature Reliability (2007 HITEN)
• Lean Process for High Temperature Hybrid Assemblies (2006 HiTEC)
• High Temperature Circuit Reliability Testing (2005 HiTEN)
• High Temperature Circuit Reliability Testing (March 2005)
• Life Testing of High Temperature Electronic Circuits for Downhole (2004 HiTEC)
• High Temperature Circuit Reliability Testing (2001 HiTEC, updated 2003)